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"Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort."

W. Robert Daasch et al. (2002)

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DOI: 10.1109/MDT.2002.1033795

access: closed

type: Journal Article

metadata version: 2020-05-17

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/journals/dt/DaaschMMC02
W. Robert Daasch, James McNames, Robert Madge, Kevin Cota:
Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort. IEEE Des. Test Comput. 19(5): 74-81 (2002)

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