"Defect Oriented Testing for Analog/Mixed-Signal Designs."

Bram Kruseman et al. (2012)

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DOI: 10.1109/MDT.2012.2210852

access: closed

type: Journal Article

metadata version: 2020-05-17

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Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing:
Defect Oriented Testing for Analog/Mixed-Signal Designs. IEEE Des. Test Comput. 29(5): 72-80 (2012)

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