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"Contactless Test of IC Pads, Pins, and TSVs via Standard Boundary Scan."

Stephen K. Sunter, Aubin Roy (2012)

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DOI: 10.1109/MDT.2012.2206363

access: closed

type: Journal Article

metadata version: 2020-05-17

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Stephen K. Sunter, Aubin Roy:
Contactless Test of IC Pads, Pins, and TSVs via Standard Boundary Scan. IEEE Des. Test Comput. 29(5): 55-62 (2012)

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