"Test and Reliability Challenges for Approximate Circuitry."

Ilia Polian (2018)

> Home

Details and statistics

DOI: 10.1109/LES.2017.2754446

access: closed

type: Journal Article

metadata version: 2020-09-10

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/esl/Polian18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/esl/Polian18
Ilia Polian:
Test and Reliability Challenges for Approximate Circuitry. IEEE Embed. Syst. Lett. 10(1): 26-29 (2018)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.