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"Logic Design Validation via Simulation and Automatic Test Pattern Generation."

Hussain Al-Asaad, John P. Hayes (2000)

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DOI: 10.1023/A:1008302118244

access: closed

type: Journal Article

metadata version: 2020-09-11

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Hussain Al-Asaad, John P. Hayes:
Logic Design Validation via Simulation and Automatic Test Pattern Generation. J. Electron. Test. 16(6): 575-589 (2000)

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