"An SEU-Resilient SRAM Bitcell in 65-nm CMOS Technology."

Qingyu Chen et al. (2016)

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DOI: 10.1007/S10836-016-5586-0

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type: Journal Article

metadata version: 2025-08-17

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Qingyu Chen, Haibin Wang, Li Chen, Lixiang Li, Xing Zhao, Rui Liu, Mo Chen, Xuantian Li:
An SEU-Resilient SRAM Bitcell in 65-nm CMOS Technology. J. Electron. Test. 32(3): 385-391 (2016)

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