Journal of Electronic Testing, Volume 32

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Volume 32, Number 1, February 2016

Volume 32, Number 2, April 2016

Volume 32, Number 3, June 2016

Volume 32, Number 4, August 2016

Special Issue on Analog, Mixed-Signal and RF Testing

Volume 32, Number 5, October 2016

Volume 32, Number 6, December 2016

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