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"Fault Modeling and Multi-Tone Dither Scheme for Testing 3D TSV Defects."

Sukeshwar Kannan, Bruce C. Kim, Byoungchul Ahn (2012)

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DOI: 10.1007/S10836-011-5263-2

access: closed

type: Journal Article

metadata version: 2020-09-11

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Sukeshwar Kannan, Bruce C. Kim, Byoungchul Ahn:
Fault Modeling and Multi-Tone Dither Scheme for Testing 3D TSV Defects. J. Electron. Test. 28(1): 39-51 (2012)

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