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"Deterministic BIST with Partial Scan."

Gundolf Kiefer, Hans-Joachim Wunderlich (2000)

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DOI: 10.1023/A:1008374811502

access: closed

type: Journal Article

metadata version: 2020-09-11

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Gundolf Kiefer, Hans-Joachim Wunderlich:
Deterministic BIST with Partial Scan. J. Electron. Test. 16(3): 169-177 (2000)

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