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"Deterministic BIST with Multiple Scan Chains."

Gundolf Kiefer, Hans-Joachim Wunderlich (1999)

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DOI: 10.1023/A:1008353423305

access: closed

type: Journal Article

metadata version: 2020-09-11

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  - https://dblp.org/rec/journals/et/KieferW99
Gundolf Kiefer, Hans-Joachim Wunderlich:
Deterministic BIST with Multiple Scan Chains. J. Electron. Test. 14(1-2): 85-93 (1999)

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