"Exploration of Noise Impact on Integrated Bulk Current Sensors."

João Guilherme Mourão Melo, Frank Sill Torres (2016)

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DOI: 10.1007/S10836-016-5579-Z

access: closed

type: Journal Article

metadata version: 2020-09-11

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João Guilherme Mourão Melo, Frank Sill Torres:
Exploration of Noise Impact on Integrated Bulk Current Sensors. J. Electron. Test. 32(2): 163-173 (2016)

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