"Assessment of Microfluidic System Testability using Fault Simulation and ..."

Thomas O. Myers, Ian M. Bell (2011)

> Home

Details and statistics

DOI: 10.1007/S10836-011-5202-2

access: closed

type: Journal Article

metadata version: 2021-10-14

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/et/MyersB11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/MyersB11
Thomas O. Myers, Ian M. Bell:
Assessment of Microfluidic System Testability using Fault Simulation and Test Metrics. J. Electron. Test. 27(3): 363-373 (2011)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.