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ORCIDIan M. Bell
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- affiliation: Department of Engineering, University of Hull, Hull, UK
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2010 – 2019
- 2013
[j9]Likun Xia, Muhammad Umer Farooq
, Ian M. Bell, Fawnizu Azmadi Hussin, Aamir Saeed Malik:
Survey and Evaluation of Automated Model Generation Techniques for High Level Modeling and High Level Fault Modeling. J. Electron. Test. 29(6): 861-877 (2013)- 2011
- [j8]Thomas O. Myers, Ian M. Bell:
Assessment of Microfluidic System Testability using Fault Simulation and Test Metrics. J. Electron. Test. 27(3): 363-373 (2011) - 2010
- [j7]Likun Xia, Ian M. Bell, Antony J. Wilkinson:
Automated Model Generation Algorithm for High-Level Fault Modeling. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(7): 1140-1145 (2010)
2000 – 2009
- 2008
- [c9]Likun Xia, Ian M. Bell, Antony J. Wilkinson:
A novel approach for automated model generation. ISCAS 2008: 504-507 - 2007
- [j6]J. M. Gilbert, Ian M. Bell:
The Effectiveness of Test in Controlling Quality Costs: A Conformability Analysis Based Approach. J. Electron. Test. 23(4): 293-307 (2007) - [j5]Nabil Hasasneh, Ian M. Bell, Chris R. Jesshope:
Asynchronous arbiter for micro-threaded chip multiprocessors. J. Syst. Archit. 53(5-6): 253-262 (2007) - [c8]Nabil Hasasneh, Ian M. Bell, Chris R. Jesshope:
High Level Modelling and Design For a Microthreaded Scheduler to Support Microgrids. AICCSA 2007: 301-308 - 2006
- [j4]Ian M. Bell, Nabil Hasasneh, Chris R. Jesshope:
Supporting Microthread Scheduling and Synchronisation in CMPs. Int. J. Parallel Program. 34(4): 343-381 (2006) - [c7]Nabil Hasasneh, Ian M. Bell, Chris R. Jesshope:
Scalable and Partitionable Asynchronous Arbiter for Micro-threaded Chip Multiprocessors. ARCS 2006: 252-267 - 2004
- [j3]Stephen J. Spinks, Chris D. Chalk, Ian M. Bell, Mark Zwolinski:
Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations. J. Electron. Test. 20(1): 11-23 (2004) - 2002
- [c6]J. M. Gilbert, Ian M. Bell, D. R. Johnson:
Design, Manufacture and Test - Quality Test Estimation. ISQED 2002: 200-205
1990 – 1999
- 1998
- [c5]Ian M. Bell, Stephen J. Spinks:
Evaluation and comparison of structural test methodologies for analogue and mixed signal circuits. ICECS 1998: 433-436 - 1997
- [j2]S. Yu, Barrie W. Jervis, Kevin R. Eckersall, Ian M. Bell:
Diagnosis of CMOS op-amps with gate oxide short faults using multilayer perceptrons. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 16(8): 930-935 (1997) - [c4]Stephen J. Spinks, Chris D. Chalk, Ian M. Bell, Mark Zwolinski:
Generation and Verification of Tests for Analogue Circuits Subject to Process Parameter Deviations. DFT 1997: 100-109 - [c3]Osama K. Abu-Shahla, Ian M. Bell:
An On-Line Self-Testing Switched-Current Integrator. ITC 1997: 463-470 - 1996
- [j1]José Machado da Silva, José Silva Matos, Ian M. Bell, Gaynor E. Taylor:
Mixed current/voltage observation towards effective testing of analog and mixed-signal circuits. J. Electron. Test. 9(1-2): 75-88 (1996) - 1995
- [c2]Ian M. Bell, Kevin R. Eckersall, Stephen J. Spinks, Gaynor E. Taylor:
Fault Orientated Test and Fault Simulation of Mixed Signal Integrated Circuits. ISCAS 1995: 389-392 - [c1]Geir E. Sæther, Chris Toumazou, Gaynor E. Taylor, Kevin R. Eckersall, Ian M. Bell:
Concurrent Self Test of Switched Current Circuits Based on the S2I-Technique. ISCAS 1995: 841-844
Coauthor Index
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