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"Optimization of Test Power and Data Volume in BIST Scheme Based on Scan ..."

Bin Zhou et al. (2011)

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DOI: 10.1007/S10836-010-5185-4

access: closed

type: Journal Article

metadata version: 2020-09-11

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Bin Zhou, Liyi Xiao, Yizheng Ye, Xin-chun Wu:
Optimization of Test Power and Data Volume in BIST Scheme Based on Scan Slice Overlapping. J. Electron. Test. 27(1): 43-56 (2011)

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