"A dither-based background calibration circuit for pipelined ADCs in 40 nm ..."

Ben He et al. (2025)

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DOI: 10.1587/ELEX.22.20240726

access: open

type: Journal Article

metadata version: 2025-08-28

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Ben He, Xuan Guo, Hanbo Jia, Kai Sun, Lei Zhou, Zhijie Chen, Xinyu Liu:
A dither-based background calibration circuit for pipelined ADCs in 40 nm CMOS. IEICE Electron. Express 22(5): 20240726 (2025)

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