"Low power logic BIST with high test effectiveness."

Weizheng Wang et al. (2013)

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DOI: 10.1587/ELEX.10.20130853

access: open

type: Journal Article

metadata version: 2025-02-27

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Weizheng Wang, Peng Liu, Shuo Cai, Lingyun Xiang:
Low power logic BIST with high test effectiveness. IEICE Electron. Express 10(23): 20130853 (2013)

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