"Test Pattern Ordering and Selection for High Quality Test Set under ..."

Michiko Inoue et al. (2012)

> Home

Details and statistics

DOI: 10.1587/TRANSINF.E95.D.3001

access: closed

type: Journal Article

metadata version: 2020-04-11

- view
  authority control:
- export record
  dblp key:
  - journals/ieicet/InoueTYF12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ieicet/InoueTYF12
Michiko Inoue, Akira Taketani, Tomokazu Yoneda, Hideo Fujiwara:
Test Pattern Ordering and Selection for High Quality Test Set under Constraints. IEICE Trans. Inf. Syst. 95-D(12): 3001-3009 (2012)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.