"A Reliable 1T1C FeRAM Using a Thermal History Tracking 2T2C Dual Reference ..."

Shoichiro Kawashima et al. (2007)

> Home

Details and statistics

DOI: 10.1093/IETELE/E90-C.10.1941

access: closed

type: Journal Article

metadata version: 2020-04-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/ieicet/KawashimaFMNNYHE07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ieicet/KawashimaFMNNYHE07
Shoichiro Kawashima, Isao Fukushi, Keizo Morita, Ken-ichi Nakabayashi, Mitsuharu Nakazawa, Kazuaki Yamane, Tomohisa Hirayama, Toru Endo:
A Reliable 1T1C FeRAM Using a Thermal History Tracking 2T2C Dual Reference Level Technique for a Smart Card Application Chip. IEICE Trans. Electron. 90-C(10): 1941-1948 (2007)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.