"A Reliability-Enhanced TCAM Architecture with Associated Embedded DRAM and ..."

Hideyuki Noda et al. (2006)

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DOI: 10.1093/IETELE/E89-C.11.1612

access: closed

type: Journal Article

metadata version: 2023-06-26

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Hideyuki Noda, Katsumi Dosaka, Hans Jürgen Mattausch, Tetsushi Koide, Fukashi Morishita, Kazutami Arimoto:
A Reliability-Enhanced TCAM Architecture with Associated Embedded DRAM and ECC. IEICE Trans. Electron. 89-C(11): 1612-1619 (2006)

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