"Multi-mode-segmented scan architecture with layout-aware scan chain ..."

Po-Chang Tsai, Sying-Jyan Wang (2008)

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DOI: 10.1049/IET-CDT:20070115

access: closed

type: Journal Article

metadata version: 2020-07-14

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Po-Chang Tsai, Sying-Jyan Wang:
Multi-mode-segmented scan architecture with layout-aware scan chain routing for test data and test time reduction. IET Comput. Digit. Tech. 2(6): 434-444 (2008)

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