"Automatic generation of test infrastructures for analog integrated ..."

Anthony Coyette et al. (2016)

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DOI: 10.1016/J.VLSI.2016.05.001

access: closed

type: Journal Article

metadata version: 2020-02-20

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Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen:
Automatic generation of test infrastructures for analog integrated circuits by controllability and observability co-optimization. Integr. 55: 393-400 (2016)

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