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"WDP-BNN: Efficient wafer defect pattern classification via binarized ..."

Qing Zhang et al. (2022)

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DOI: 10.1016/J.VLSI.2022.04.003

access: closed

type: Journal Article

metadata version: 2024-01-31

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Qing Zhang, Yuhang Zhang, Jizuo Li, Yongfu Li:
WDP-BNN: Efficient wafer defect pattern classification via binarized neural network. Integr. 85: 76-86 (2022)

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