"A test set embedding approach based on twisted-ring counter with few seeds."

Bin Zhou et al. (2010)

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DOI: 10.1016/J.VLSI.2009.06.001

access: closed

type: Journal Article

metadata version: 2020-02-20

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Bin Zhou, Yizheng Ye, Zhao-lin Li, Jianwei Zhang, Xin-chun Wu, Rui Ke:
A test set embedding approach based on twisted-ring counter with few seeds. Integr. 43(1): 81-100 (2010)

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