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"A Cross-Layer Approach to Measure the Robustness of Integrated Circuits."

Martin Barke, Ulf Schlichtmann (2015)

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DOI: 10.1145/2743022

access: closed

type: Journal Article

metadata version: 2020-06-08

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  - journals/jetc/BarkeS15
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  persistent URL:
  - https://dblp.org/rec/journals/jetc/BarkeS15
Martin Barke, Ulf Schlichtmann:
A Cross-Layer Approach to Measure the Robustness of Integrated Circuits. ACM J. Emerg. Technol. Comput. Syst. 12(3): 24:1-24:22 (2015)

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