"Extensive Laser Fault Injection Profiling of 65 nm FPGA."

Jakub Breier et al. (2017)

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DOI: 10.1007/S41635-017-0016-Z

access: closed

type: Journal Article

metadata version: 2024-07-21

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  - https://dblp.org/rec/journals/jhss/BreierHBJCOG17
Jakub Breier, Wei He, Shivam Bhasin, Dirmanto Jap, Samuel Chef, Hock Guan Ong, Chee Lip Gan:
Extensive Laser Fault Injection Profiling of 65 nm FPGA. J. Hardw. Syst. Secur. 1(3): 237-251 (2017)

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