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ORCID"CMOS transistor faults and bridging faults: Testability by delay effects ..."
Uwe Hübner, Wolfgang Meyer, Heinrich Theodor Vierhaus (1992)
- Uwe Hübner, Wolfgang Meyer, Heinrich Theodor Vierhaus:
CMOS transistor faults and bridging faults: Testability by delay effects and overcurrents. Microprocess. Microprogramming 35(1-5): 377-382 (1992)
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