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"The impact of NMOSFET hot-carrier degradation on CMOS analog subcircuit ..."

Vei-Han Chan, James E. Chung (1995)

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DOI: 10.1109/4.387067

access: closed

type: Journal Article

metadata version: 2023-05-03

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Vei-Han Chan, James E. Chung:
The impact of NMOSFET hot-carrier degradation on CMOS analog subcircuit performance. IEEE J. Solid State Circuits 30(6): 644-649 (1995)

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