"Processor-based built-in self-test for embedded DRAM."

Jeffrey H. Dreibelbis et al. (1998)

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DOI: 10.1109/4.726568

access: closed

type: Journal Article

metadata version: 2022-07-05

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Jeffrey H. Dreibelbis, John Barth, Howard L. Kalter, Rex Kho:
Processor-based built-in self-test for embedded DRAM. IEEE J. Solid State Circuits 33(11): 1731-1740 (1998)

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