"A 28 nm Dual-Port SRAM Macro With Screening Circuitry Against Write-Read ..."

Yuichiro Ishii et al. (2011)

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DOI: 10.1109/JSSC.2011.2164021

access: closed

type: Journal Article

metadata version: 2020-08-30

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Yuichiro Ishii, Hidehiro Fujiwara, Shinji Tanaka, Yasumasa Tsukamoto, Koji Nii, Yuji Kihara, Kazumasa Yanagisawa:
A 28 nm Dual-Port SRAM Macro With Screening Circuitry Against Write-Read Disturb Failure Issues. IEEE J. Solid State Circuits 46(11): 2535-2544 (2011)

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