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"X-Calibration: A Technique for Combating Excessive Bitline Leakage Current ..."

Ya-Chun Lai, Shi-Yu Huang (2008)

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DOI: 10.1109/JSSC.2008.2001937

access: closed

type: Journal Article

metadata version: 2020-08-30

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Ya-Chun Lai, Shi-Yu Huang:
X-Calibration: A Technique for Combating Excessive Bitline Leakage Current in Nanometer SRAM Designs. IEEE J. Solid State Circuits 43(9): 1964-1971 (2008)

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