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"Sensitivity Degradation in a Tri-Band GSM BiCMOS Direct-Conversion ..."

Sven Mattisson, Hans Hagberg, Pietro Andreani (2008)

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DOI: 10.1109/JSSC.2007.914306

access: closed

type: Journal Article

metadata version: 2020-08-30

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  - https://dblp.org/rec/journals/jssc/MattissonHA08
Sven Mattisson, Hans Hagberg, Pietro Andreani:
Sensitivity Degradation in a Tri-Band GSM BiCMOS Direct-Conversion Receiver Caused by Transient Substrate Heating. IEEE J. Solid State Circuits 43(2): 486-496 (2008)

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