"An On-Chip Test Structure and Digital Measurement Method for Statistical ..."

Saibal Mukhopadhyay et al. (2008)

> Home

Details and statistics

DOI: 10.1109/JSSC.2008.2001896

access: closed

type: Journal Article

metadata version: 2020-08-30

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jssc/MukhopadhyayKJC08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jssc/MukhopadhyayKJC08
Saibal Mukhopadhyay, Keunwoo Kim, Keith A. Jenkins, Ching-Te Chuang, Kaushik Roy:
An On-Chip Test Structure and Digital Measurement Method for Statistical Characterization of Local Random Variability in a Process. IEEE J. Solid State Circuits 43(9): 1951-1963 (2008)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.