"An automatic temperature compensation of internal sense ground for ..."

Tsukasa Ooishi et al. (1995)

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DOI: 10.1109/4.375968

access: closed

type: Journal Article

metadata version: 2023-05-03

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Tsukasa Ooishi, Yuichiro Komiya, Kei Hamade, Mho Asakura, Kenichi Yasuda, Kiyohiro Furutani, Hideto Hidaka, Hiroshi Miyamoto, Hideyuki Ozaki:
An automatic temperature compensation of internal sense ground for subquarter micron DRAM's. IEEE J. Solid State Circuits 30(4): 471-479 (1995)

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