"Investigation of interconnect capacitance characterization using ..."

Dennis Sylvester, James C. Chen, Chenming Hu (1998)

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DOI: 10.1109/4.661210

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type: Journal Article

metadata version: 2022-07-05

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Dennis Sylvester, James C. Chen, Chenming Hu:
Investigation of interconnect capacitance characterization using charge-based capacitance measurement (CBCM) technique and three-dimensional simulation. IEEE J. Solid State Circuits 33(3): 449-453 (1998)

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