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"A functional-level testability measure for register-level circuits and its ..."

C. P. Ravikumar, Gurjeet S. Saund, Nidhi Agrawal (1999)

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DOI: 10.1016/S0141-9331(98)00111-2

access: closed

type: Journal Article

metadata version: 2020-02-22

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C. P. Ravikumar, Gurjeet S. Saund, Nidhi Agrawal:
A functional-level testability measure for register-level circuits and its estimation. Microprocess. Microsystems 22(9): 535-542 (1999)

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