Stop the war!
Остановите войну!
for scientists:
default search action
"Impact of technology scaling on leakage power in nano-scale bulk CMOS ..."
Zia Abbas, Mauro Olivieri (2014)
- Zia Abbas, Mauro Olivieri:
Impact of technology scaling on leakage power in nano-scale bulk CMOS digital standard cells. Microelectron. J. 45(2): 179-195 (2014)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.