"On-Line Testing of digital VLSI circuits at Register Transfer Level using ..."

Pradeep Kumar Biswal, Santosh Biswas (2017)

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DOI: 10.1016/J.MEJO.2017.08.002

access: closed

type: Journal Article

metadata version: 2020-02-22

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Pradeep Kumar Biswal, Santosh Biswas:
On-Line Testing of digital VLSI circuits at Register Transfer Level using High Level Decision Diagrams. Microelectron. J. 67: 88-100 (2017)

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