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"Simulation and comparison of two sequential logic-in-memory approaches ..."

S. Ferch et al. (2014)

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DOI: 10.1016/J.MEJO.2014.09.012

access: closed

type: Journal Article

metadata version: 2020-02-22

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S. Ferch, Eike Linn, Rainer Waser, Stephan Menzel:
Simulation and comparison of two sequential logic-in-memory approaches using a dynamic electrochemical metallization cell model. Microelectron. J. 45(11): 1416-1428 (2014)

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