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"A reliable guideline to maximize the detection and analysis of deep level ..."

Mounir Hanine, M. Masmoudi (2006)

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DOI: 10.1016/J.MEJO.2006.05.034

access: closed

type: Journal Article

metadata version: 2022-11-15

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Mounir Hanine, M. Masmoudi:
A reliable guideline to maximize the detection and analysis of deep level defects: Comparison between DLTS analysis techniques. Microelectron. J. 37(11): 1188-1193 (2006)

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