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"Electrical property dependence on thickness and morphology of ..."

T. Izák et al. (2009)

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DOI: 10.1016/J.MEJO.2008.06.095

access: closed

type: Journal Article

metadata version: 2022-10-04

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  - journals/mj/IzakVVSNMR09
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  - https://dblp.org/rec/journals/mj/IzakVVSNMR09
T. Izák, Marian Vojs, Marián Veselý, Jaroslava Skriniarová, I. Novotný, Miroslav Michalka, R. Redhammer:
Electrical property dependence on thickness and morphology of nanocrystalline diamond thin films. Microelectron. J. 40(3): 615-617 (2009)

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