"Measuring resistivity of silicon nanowire using pseudo-random binary ..."

Tomi Roinila et al. (2014)

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DOI: 10.1016/J.MEJO.2014.03.007

access: closed

type: Journal Article

metadata version: 2024-08-04

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Tomi Roinila, Hongjiang Zeng, Jarmo Verho, Yu Xiao, Matti Vilkko, Pasi Kallio, Jukka Lekkala, Tie Li, Yuelin Wang:
Measuring resistivity of silicon nanowire using pseudo-random binary sequence injection. Microelectron. J. 45(7): 976-980 (2014)

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