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"MIMC reliability and electrical behavior defined by a physical layer ..."

Jan Ackaert et al. (2008)

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DOI: 10.1016/J.MICROREL.2008.06.043

access: closed

type: Journal Article

metadata version: 2021-04-21

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  - journals/mr/AckaertCDVSMVBIBVR08
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  - https://dblp.org/rec/journals/mr/AckaertCDVSMVBIBVR08
Jan Ackaert, R. Charavel, K. Dhondt, B. Vlachakis, Luc De Schepper, M. Millecam, E. Vandevelde, P. Bogaert, A. Iline, Eddy De Backer, Alexandru Vlad, Jean-Pierre Raskin:
MIMC reliability and electrical behavior defined by a physical layer property of the dielectric. Microelectron. Reliab. 48(8-9): 1553-1556 (2008)

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