"Evolution of oxide charge trapping under bias temperature stressing."

Diing Shenp Ang et al. (2014)

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DOI: 10.1016/J.MICROREL.2014.01.025

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type: Journal Article

metadata version: 2023-11-12

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Diing Shenp Ang, Chenjie Gu, Z. Y. Tung, A. A. Boo, Yuan Gao:
Evolution of oxide charge trapping under bias temperature stressing. Microelectron. Reliab. 54(4): 663-681 (2014)

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