"Evidence for source side injection hot carrier effects on lateral DMOS ..."

Stefano Aresu et al. (2004)

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DOI: 10.1016/J.MICROREL.2004.07.080

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type: Journal Article

metadata version: 2022-10-02

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Stefano Aresu, Ward De Ceuninck, Geert Van den Bosch, Guido Groeseneken, Peter Moens, Jean Manca, D. Wojciechowski, P. Gassot:
Evidence for source side injection hot carrier effects on lateral DMOS transistors. Microelectron. Reliab. 44(9-11): 1621-1624 (2004)

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