"A new structure to monitor electrical transients during programming of ..."

Nicolas Baboux, Carole Plossu, Philippe Boivin (2004)

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DOI: 10.1016/J.MICROREL.2004.07.067

access: closed

type: Journal Article

metadata version: 2020-02-22

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Nicolas Baboux, Carole Plossu, Philippe Boivin:
A new structure to monitor electrical transients during programming of EEPROM memory cells. Microelectron. Reliab. 44(9-11): 1745-1750 (2004)

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