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"Destructive events in NAND Flash memories irradiated with heavy ions."

Marta Bagatin et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.07.032

access: closed

type: Journal Article

metadata version: 2023-04-22

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Marta Bagatin, Simone Gerardin, Alessandro Paccagnella, Giorgio Cellere, F. Irom, D. N. Nguyen:
Destructive events in NAND Flash memories irradiated with heavy ions. Microelectron. Reliab. 50(9-11): 1832-1836 (2010)

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