"Dc and low frequency noise analysis of hot-carrier induced degradation of ..."

P. Benoit et al. (2005)

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DOI: 10.1016/J.MICROREL.2005.07.097

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type: Journal Article

metadata version: 2023-08-10

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P. Benoit, Jérémy Raoult, C. Delseny, Fabien Pascal, L. Snadny, J. C. Vildeuil, M. Marin, B. Martinet, D. Cottin, Olivier Noblanc:
Dc and low frequency noise analysis of hot-carrier induced degradation of low complexity 0.13 mum CMOS bipolar transistors. Microelectron. Reliab. 45(9-11): 1800-1806 (2005)

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