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"Modeling the behavior of amorphous oxide thin film transistors before and ..."
Antonio Cerdeira et al. (2012)
- Antonio Cerdeira, Magali Estrada, Blanca S. Soto-Cruz, Benjamín Iñíguez:
Modeling the behavior of amorphous oxide thin film transistors before and after bias stress. Microelectron. Reliab. 52(11): 2532-2536 (2012)
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