"Understanding and modeling of internal transient latch-up susceptibility ..."

Jie Chen, Zhengwei Du (2013)

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DOI: 10.1016/J.MICROREL.2013.07.004

access: closed

type: Journal Article

metadata version: 2020-02-22

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Jie Chen, Zhengwei Du:
Understanding and modeling of internal transient latch-up susceptibility in CMOS inverters due to microwave pulses. Microelectron. Reliab. 53(12): 1891-1896 (2013)

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