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"Sidewall defects of AlGaN/GaN HEMTs evaluated by low frequency noise analysis."

Hsien-Chin Chiu et al. (2013)

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DOI: 10.1016/J.MICROREL.2013.06.015

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/ChiuCKCWGC13
Hsien-Chin Chiu, Chao-Hung Chen, Hsuan-Ling Kao, Feng-Tso Chien, Ping-Kuo Weng, Yan-Tang Gau, Hao-Wei Chuang:
Sidewall defects of AlGaN/GaN HEMTs evaluated by low frequency noise analysis. Microelectron. Reliab. 53(12): 1897-1900 (2013)

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